Scaling studies of frustrated systems, random-field tricriticality, electronic conduction models, and interface delocalization
Name
44011063-MIT.pdf
Description
Full printable version
Size
5.29 MB
Format
Adobe PDF
Checksum (MD5)
d44aca0865f93c228044f34f6790ae6a
Author(s)
Kabakıoğlu, Alkan, 1968-
Advisor(s)
A. Nihat Berker.
Date Issued
1999
Publisher
Massachusetts Institute of Technology
Description
Thesis (Ph.D.)--Massachusetts Institute of Technology, Dept. of Physics, 1999.
Includes bibliographical references.
Subjects
Physics.
MIT Department
Massachusetts Institute of Technology. Department of Physics
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