Super-resolved second harmonic generation imaging by coherent image scanning microscopy
Name
071111_1_online.pdf
Description
Published version
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3.06 MB
Format
Adobe PDF
Checksum (MD5)
eb2530775d036025253437a40a2a951c
Author(s)
Raanan, Dekel
Song, Man Suk
Tisdale, William A
Oron, Dan
Date Issued
February 18, 2022
Journal
Applied Physics Letters
Publisher
AIP Publishing
Citation
Dekel Raanan, Man Suk Song, William A. Tisdale, Dan Oron; Super-resolved second harmonic generation imaging by coherent image scanning microscopy. Appl. Phys. Lett. 14 February 2022; 120 (7): 071111.
Version
Final published version
Abstract
We extend image scanning microscopy to second harmonic generation (SHG) by extracting the complex field amplitude of the second-harmonic beam. While the theory behind coherent image scanning microscopy (ISM) is known, an experimental demonstration was not yet established. The main reason is that the naive intensity-reassignment procedure cannot be used for coherent scattering as the point spread function is now defined for the field amplitude rather than for the intensity. We use an inline interferometer to demonstrate super-resolved phase-sensitive SHG microscopy by applying the ISM reassignment machinery on the resolved field. This scheme can be easily extended to third harmonic generation and stimulated Raman microscopy schemes.
MIT Department
Massachusetts Institute of Technology. Department of Chemical Engineering
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Creative Commons Attribution
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DOI of Published Version
10.1063/5.0073161
