Ultrahigh Speed Imaging of the Rat Retina Using Ultrahigh Resolution Spectral/Fourier Domain OCT
Name
Fujimoto-Ultrahigh-speed Imaging.pdf
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3.23 MB
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Adobe PDF
Checksum (MD5)
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Author(s)
Liu, Jonathan Jaoshin
Potsaid, Benjamin M.
Chen, Yueli
Gorczynska, Iwona
Srinivasan, Vivek J.
Duker, Jay S.
Fujimoto, James G.
Date Issued
March 2010
Journal
Proceedings of SPIE--the International Society for Optical Engineering
Publisher
SPIE
Citation
Jonathan J. Liu ; Benjamin Potsaid ; Yueli Chen ; Iwona Gorczynska ; Vivek J. Srinivasan ; Jay S. Duker ; James G. Fujimoto; Ultrahigh-speed imaging of the rat retina using ultrahigh-resolution spectral/Fourier domain OCT. Proc. SPIE 7550, Ophthalmic Technologies XX, 755017 (March 02, 2010). SPIE © 2010
Version
Final published version
Abstract
We performed OCT imaging of the rat retina at 70,000 axial scans per second with ~3 μm axial resolution. Three-dimensional OCT (3D-OCT) data sets of the rat retina were acquired. The high speed and high density data sets enable improved en face visualization by reducing eye motion artifacts and improve Doppler OCT measurements. Minimal motion artifacts were visible and the OCT fundus images offer more precise registration of individual OCT images to retinal fundus features. Projection OCT fundus images show features such as the nerve fiber layer, retinal capillary networks and choroidal vasculature. Doppler OCT images and quantitative measurements show pulsatility in retinal blood vessels. Doppler OCT provides noninvasive in vivo quantitative measurements of retinal blood flow properties and may benefit studies of diseases such as glaucoma and diabetic retinopathy. Ultrahigh speed imaging using ultrahigh resolution spectral / Fourier domain OCT promises to enable novel protocols for measuring small animal retinal structure and retinal blood flow. This non-invasive imaging technology is a promising tool for monitoring disease progression in rat and mouse models to assess ocular disease pathogenesis and response to treatment.
MIT Department
Massachusetts Institute of Technology. Department of Electrical Engineering and Computer Science
Massachusetts Institute of Technology. Research Laboratory of Electronics
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Article is made available in accordance with the publisher's policy and may be subject to US copyright law. Please refer to the publisher's site for terms of use.
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DOI of Published Version
https://doi.org/10.1117/12.842540
