End-to-end metasurface inverse design for single-shot multi-channel imaging
Name
oe-30-16-28358.pdf
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9.59 MB
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Adobe PDF
Checksum (MD5)
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Author(s)
Lin, Zin
Pestourie, Raphaël
Roques-Carmes, Charles
Li, Zhaoyi
Capasso, Federico
Soljačić, Marin
Johnson, Steven G.
Date Issued
July 19, 2022
Publisher
Optica Publishing Group
Citation
Lin, Zin, Pestourie, Raphaël, Roques-Carmes, Charles, Li, Zhaoyi, Capasso, Federico et al. 2022. "End-to-end metasurface inverse design for single-shot multi-channel imaging." 30 (16).
Version
Final published version
Abstract
We introduce end-to-end inverse design for multi-channel imaging, in which a nanophotonic frontend is optimized in conjunction with an image-processing backend to extract depth, spectral and polarization channels from a single monochrome image. Unlike diffractive optics, we show that subwavelength-scale “metasurface” designs can easily distinguish similar wavelength and polarization inputs. The proposed technique integrates a single-layer metasurface frontend with an efficient Tikhonov reconstruction backend, without any additional optics except a grayscale sensor. Our method yields multi-channel imaging by spontaneous demultiplexing: the metaoptics front-end separates different channels into distinct spatial domains whose locations on the sensor are optimally discovered by the inverse-design algorithm. We present large-area metasurface designs, compatible with standard lithography, for multi-spectral imaging, depth-spectral imaging, and “all-in-one” spectro-polarimetric-depth imaging with robust reconstruction performance (≲ 10% error with 1% detector noise). In contrast to neural networks, our framework is physically interpretable and does not require large training sets. It can be used to reconstruct arbitrary three-dimensional scenes with full multi-wavelength spectra and polarization textures.
Subjects
Atomic and Molecular Physics, and Optics
MIT Department
Massachusetts Institute of Technology. Department of Mathematics
Massachusetts Institute of Technology. Research Laboratory of Electronics
Massachusetts Institute of Technology. Department of Physics
Terms of Use
Article is made available in accordance with the publisher's policy and may be subject to US copyright law. Please refer to the publisher's site for terms of use.
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DOI of Published Version
https://doi.org/10.1364/oe.449985
