An Efficient Resistance Sensitivity Extraction Algorithm for Conductors of Arbitrary Shapes
Name
El-Moselhy-2009-An efficient resistance sensitivity extraction algorithm for conductors of arbitrary shapes.pdf
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509.44 KB
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Author(s)
Elfadel, Ibrahim M.
El-Moselhy, Tarek Ali
Dewey, Bill
Date Issued
August 2009
Journal
46th ACM/IEEE Design Automation Conference, 2009. DAC '09.
Publisher
Institute of Electrical and Electronics Engineers
Citation
Dewey, B., I.M. Elfadel, and T. El-Moselhy. “An efficient resistance sensitivity extraction algorithm for conductors of arbitrary shapes.” Design Automation Conference, 2009. DAC '09. 46th ACM/IEEE. 2009. 770-775. © 2009 IEEE
Version
Final published version
Abstract
Due to technology scaling, integrated circuit manufacturing techniques are producing structures with large variabilities in their dimensions. To guarantee high yield, the manufactured structures must have the proper electrical characteristics despite such geometrical variations. For a designer, this means extracting the electrical characteristics of a whole family of structure realizations in order to guarantee that they all satisfy the required electrical characteristics. Sensitivity extraction provides an efficient algorithm to extract all realizations concurrently. This paper presents a complete framework for efficient resistance sensitivity extraction. The framework is based on both the finite element method (FEM) for resistance extraction and the adjoint method for sensitivity analysis. FEM enables the calculation of resistances of interconnects of arbitrary shapes, while the adjoint method enables sensitivity calculation in a computational complexity that is independent of the number of varying parameters. The accuracy and efficiency of the algorithm are demonstrated on a variety of complex examples.
Subjects
shape variations
sensitivity
resistance extraction
finite-element method
adjoint method
MIT Department
Massachusetts Institute of Technology. Department of Aeronautics and Astronautics
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Article is made available in accordance with the publisher's policy and may be subject to US copyright law. Please refer to the publisher's site for terms of use.
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