Maximizing Reliability in WDM Networks through Lightpath Routing
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Globecom2011 (HW&Kyi) copy.pdf
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165.9 KB
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Author(s)
Lee, Hyang Won
Lee, Kayi
Modiano, Eytan H
Date Issued
January 2012
Journal
2011 IEEE Global Telecommunications Conference - GLOBECOM 2011
Publisher
Institute of Electrical and Electronics Engineers (IEEE)
Citation
Hyang-Won Lee, et al. "Maximizing Reliability in WDM Networks through Lightpath Routing." 2011 IEEE Global Telecommunications Conference - GLOBECOM 2011, 5-9 December, 2011, Kathmandu, Nepal, IEEE, 2011, pp. 1–6.
Version
Author's final manuscript
Abstract
We study the reliability maximization problem in WDM networks with random link failures. Reliability in these networks is defined as the probability that the logical network is connected, and it is determined by the underlying lightpath
routing and the link failure probability. We show that in general the optimal lightpath routing depends on the link failure probability, and characterize the properties of lightpath routings that maximize the reliability in different failure probability regimes. In particular, we show that in the low failure probability regime, maximizing the “cross-layer” min cut of the (layered) network maximizes reliability, whereas in the high failure probability regime, minimizing the spanning tree of the network maximizes reliability. Motivated by these results, we develop lightpath routing algorithms for reliability maximization.
MIT Department
Massachusetts Institute of Technology. Department of Aeronautics and Astronautics
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Creative Commons Attribution-Noncommercial-Share Alike
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DOI of Published Version
https://doi.org/10.1109/GLOCOM.2011.6133868
