Direct and quantitative absorptive spectroscopy of nanowires
Name
830378223-MIT.pdf
Description
Full printable version
Size
11.74 MB
Format
Adobe PDF
Checksum (MD5)
22057ddc4d1f78f39f595145dcb4d301
Author(s)
Tong, Jonathan Kien-Kwok
Advisor(s)
Gang Chen.
Date Issued
2012
Publisher
Massachusetts Institute of Technology
Abstract
Photonic nanostructures exhibit unique optical properties that are attractive in many different applications. However, measuring the optical properties of individual nanostructures, in particular the absorptive properties, remains a significant challenge. Conventional methods typically provide either an indirect or qualitative measure of absorption. The objective of this thesis is to therefore demonstrate a method capable of directly and quantitatively measuring the absorptive properties of individual nanostructures. This method is based on atomic force microscope (AFM) cantilever thermometry where a bimorph cantilever is used as a heat flux sensor. These sensors operate on the principle of a thermomechanical bending response and by virtue of their dimensionality, are capable of picowatt sensitivity. To validate the use of this technique, a single silicon nanowire is measured. By attaching a silicon nanowire to a cantilever and illuminating the sample with monochromatic light, the absolute absorptance spectrum of the nanowire was measured and shown to match well with theory. This spectroscopic technique can conceivably be used to measure even smaller samples, samples which cannot be characterized using conventional methods.
Description
Thesis (S.M.)--Massachusetts Institute of Technology, Dept. of Mechanical Engineering, 2012.
Cataloged from PDF version of thesis.
Includes bibliographical references (p. 125-130).
Subjects
Mechanical Engineering.
MIT Department
Massachusetts Institute of Technology. Department of Mechanical Engineering
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