RADIAL PROFILE OF THE 3.5 keV LINE OUT TO R[subscript 200] IN THE PERSEUS CLUSTER
Name
Franse-2016-RADIAL PROFILE of the 3.5 keV LINE.pdf
Size
2.37 MB
Format
Adobe PDF
Checksum (MD5)
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Author(s)
Franse, Jeroen
Foster, Adam
Boyarsky, Alexey
Markevitch, Maxim
Iakubovskyi, Dmytro
Loewenstein, Mike
Miller, Eric
Randall, Scott W.
Ruchayskiy, Oleg
Smith, Randall K.
Alternative Title
RADIAL PROFILE OF THE 3.5 keV LINE OUT TO R 200 IN THE PERSEUS CLUSTER
Date Issued
October 2016
Journal
Astrophysical Journal
Publisher
IOP Publishing
Citation
Franse, Jeroen et al. “RADIAL PROFILE OF THE 3.5 keV LINE OUT TO R 200 IN THE PERSEUS CLUSTER.” The Astrophysical Journal 829.2 (2016): 124. © 2016 The American Astronomical Society
Version
Final published version
Abstract
The recent discovery of the unidentified emission line at 3.5 keV in galaxies and clusters has attracted great interest from the community. As the origin of the line remains uncertain, we study the surface brightness distribution of the line in the Perseus cluster since that information can be used to identify its origin. We examine the flux distribution of the 3.5 keV line in the deep Suzaku observations of the Perseus cluster in detail. The 3.5 keV line is observed in three concentric annuli in the central observations, although the observations of the outskirts of the cluster did not reveal such a signal. We establish that these detections and the upper limits from the non-detections are consistent with a dark matter decay origin. However, absence of positive detection in the outskirts is also consistent with some unknown astrophysical origin of the line in the dense gas of the Perseus core, as well as with a dark matter origin with a steeper dependence on mass than the dark matter decay. We also comment on several recently published analyses of the 3.5 keV line.
MIT Department
Massachusetts Institute of Technology. Department of Physics
MIT Kavli Institute for Astrophysics and Space Research
Terms of Use
Article is made available in accordance with the publisher's policy and may be subject to US copyright law. Please refer to the publisher's site for terms of use.
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DOI of Published Version
https://doi.org/10.3847/0004-637X/829/2/124
