Effective use of test data for quality improvement and cycle time reduction in radio system manufacturing
Name
34296136-MIT.pdf
Description
Full printable version
Size
3.94 MB
Format
Adobe PDF
Checksum (MD5)
9861b62ea9bbb68253c9b3b0bd554249
Author(s)
Haag, Lance Edward
Advisor(s)
Steven D. Eppinger.
Date Issued
1995
Publisher
Massachusetts Institute of Technology
Description
Thesis (M.S.)--Massachusetts Institute of Technology, Sloan School of Management, 1995, and Thesis (M.S.)--Massachusetts Institute of Technology, Dept. of Electrical Engineering and Computer Science, 1995.
Includes bibliographical references (leaves 66-67).
Subjects
Sloan School of Management
Electrical Engineering and Computer Science
MIT Department
Sloan School of Management
Massachusetts Institute of Technology. Department of Electrical Engineering and Computer Science
Terms of Use
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