Analysis and Design of Regular Structures for Robust Dynamic Fault Testability
Name
VLSI.1993.038536.pdf
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2.32 MB
Format
Adobe PDF
Checksum (MD5)
aa50e4d21d85ddf42d8a2fca67d56a02
Author(s)
Bryan, Michael J.
Devadas, Srinivas
Keutzer, Kurt
Date Issued
1993
Journal
VLSI Design
Publisher
Hindawi Publishing Corporation
Citation
Bryan, Michael J., Srinivas Devadas, and Kurt Keutzer. “Analysis and Design of Regular Structures for Robust Dynamic Fault Testability.” VLSI Design 1, no. 1 (1993): 45–60. © 1993 Hindawi Publishing Corporation
Version
Final published version
Abstract
Recent methods of synthesizing logic that is fully and robustly testable for dynamic faults, namely path delay, transistor stuck-open and gate delay faults, rely almost exclusively on flattening given logic expressions into sum-of-products form, minimizing the cover to obtain a fully dynamic-fault testable two-level representation of the functions, and performing structural transformations to resynthesize the circuit into a multilevel network, while also maintaining full dynamic-fault testability. While this technique will work well for random or control logic, it is not practical for many regular structures.To deal with the synthesis of regular structures for dynamic-fault testability, we present a method that involves the development of a library of cells for these regular structures such that the cells are all fully path-delay-fault, transistor stuck-open fault or gate-delay-fault testable. These cells can then be utilized whenever one of these standard functions is encountered.We analyze various regular structures such as adders, arithmetic logic units, comparators, multipliers, and parity generators to determine if they are testable for dynamic faults, or how they can be modified to be testable for dynamic faults while still maintaining good area and performance characteristics. In addition to minimizing the area and delay, another key consideration is to get designs which can be scaled to an arbitrary number of bits while still maintaining complete testability. In each case, the emphasis is on obtaining circuits which are fully path-delay-fault testable. In the process of design modification to produce fully robustly testable structures, we have derived a number of new composition rules that allow cascading individual modules while maintaining robust
testability under dynamic fault models.
MIT Department
Massachusetts Institute of Technology. Department of Electrical Engineering and Computer Science
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DOI of Published Version
https://doi.org/10.1155/1993/38536
