Improving production testing of RF products in a noisy measurement environment
Name
35748415-MIT.pdf
Description
Full printable version
Size
4.3 MB
Format
Adobe PDF
Checksum (MD5)
976ca591c825ebca5a70eaabf53e68d7
Author(s)
Myers, M. Parker (Marion Parker)
Advisor(s)
Anant Balakrishnan, John G. Kassakian.
Date Issued
1996
Publisher
Massachusetts Institute of Technology
Description
Thesis (M.S.)--Massachusetts Institute of Technology, Sloan School of Management, 1996, and Thesis (M.S.)--Massachusetts Institute of Technology, Dept. of Electrical Engineering and Computer Science, 1996.
Includes bibliographical references (leaf 60).
Subjects
Sloan School of Management
Electrical Engineering and Computer Science
MIT Department
Sloan School of Management
Massachusetts Institute of Technology. Department of Electrical Engineering and Computer Science
Terms of Use
M.I.T. theses are protected by copyright. They may be viewed from this source for any purpose, but reproduction or distribution in any format is prohibited without written permission. See provided URL for inquiries about permission.
Persistent DSpace Link
