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Resonance-enhanced waveguide-coupled silicon-germanium detector

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Author(s)
Alloatti, Luca
•
Ram, Rajeev J
Date Issued
February 2016
Journal
Applied Physics Letters
Publisher
American Institute of Physics (AIP)
Citation
Alloatti, L. and Ram, R. J. “Resonance-Enhanced Waveguide-Coupled Silicon-Germanium Detector.” Applied Physics Letters 108, 7 (February 2016): 071105 © 2016 AIP Publishing LLC
Version
Final published version
Abstract
A photodiode with 0.55 ± 0.1 A/W responsivity at a wavelength of 1176.9 nm has been fabricated in a 45 nm microelectronics silicon-on-insulator foundry process. The resonant waveguide photodetector exploits carrier generation in silicon-germanium within a microring which is compatible with high-performance electronics. A 3 dB bandwidth of 5 GHz at −4 V bias is obtained with a dark current of less than 20 pA.
MIT Department
Massachusetts Institute of Technology. Department of Electrical Engineering and Computer Science
Massachusetts Institute of Technology. Research Laboratory of Electronics
Terms of Use
Article is made available in accordance with the publisher's policy and may be subject to US copyright law. Please refer to the publisher's site for terms of use.
Persistent DSpace Link
http://hdl.handle.net/1721.1/110934
DOI of Published Version
http://dx.doi.org/10.1063/1.4941995
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