Active Polarimetric Measurements for Identification and Characterization of Space Debris
Name
TAES Paper - Pasqual Cahoy (1).pdf
Description
Accepted version
Size
1.14 MB
Format
Adobe PDF
Checksum (MD5)
244f2ebd2918c586cef821116808251b
Author(s)
Pasqual, Michael C
Cahoy, Kerri L
Date Issued
2017
Journal
IEEE Transactions on Aerospace and Electronic Systems
Publisher
Institute of Electrical and Electronics Engineers (IEEE)
Version
Author's final manuscript
Abstract
© 1965-2011 IEEE. A bench-top polarimeter (λ = 1064 nm) is used to measure the polarimetric bidirectional reflectance distribution function of several common spacecraft materials in both bistatic and monostatic geometries. The Mueller matrix and polarimetric properties of each material were estimated as a function of the illumination and viewing angles. The findings expand upon previous research suggesting that active polarimetry may be useful for the remote characterization and identification of space debris.
MIT Department
Massachusetts Institute of Technology. Department of Aeronautics and Astronautics
Terms of Use
Creative Commons Attribution-Noncommercial-Share Alike
Persistent DSpace Link
DOI of Published Version
https://doi.org/10.1109/TAES.2017.2711718
