Vascularized drusen: a cross-sectional study
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40942_2019_Article_187.pdf
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Author(s)
Or, Chris
Heier, Jeffrey S
Boyer, David
Brown, David
Shah, Sumit
Alibhai, Agha Y
Fujimoto, James G
Waheed, Nadia
Date Issued
August 20, 2019
Journal
International Journal of Retina and Vitreous
Publisher
BioMed Central
Citation
Or, Chris et al. "Vascularized drusen: a cross-sectional study." International Journal of Retina and Vitreous 5 (August 2019): 36 ©2019 Author(s)
Version
Final published version
Abstract
BACKGROUND: To investigate whether neovascularization may arise and be detectable in drusen, as reported in histopathologic studies, by OCTA prior to developing exudation and to assess its prevalence in a cohort of patients with intermediate AMD. METHODS: Retrospective cross-sectional study of 128 patients with intermediate AMD recruited as part of a separate ongoing clinical trial conducted at multiple large tertiary referral retina clinics. One hundred and twenty-eight consecutive patients with exudative AMD in one eye and intermediate non-exudative AMD in the fellow eye were enrolled and analyzed between September 2015 and March 2017. RESULTS: SD-OCTA identified vascularization within drusen in 7 of 128 eyes, for a prevalence of 5.5%. A total of 12 instances of vascularized drusen were noted. Out of the 12 vascularized drusen noted, 7 were located in the parafoveal region or subfoveal region and 5 was in the extrafoveal region. 9 of 12 instances of vascularized drusen exhibited a uniform sub-RPE hyperreflectivity, whilst 3 of 12 exhibited more heterogenous reflectivity. In all 12 instances, FA images failed to identify the neovascular nature of vascularized drusen. CONCLUSIONS: Our results demonstrate the utility of SD-OCTA for the diagnosis of vascularized drusen in patients with intermediate non-exudative AMD. Longitudinal studies are needed to delineate the evolution and conversion risk of these lesions over time, which can be of substantial clinical relevance.
MIT Department
Massachusetts Institute of Technology. Department of Electrical Engineering and Computer Science
Massachusetts Institute of Technology. Research Laboratory of Electronics
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DOI of Published Version
https://doi.org/10.1186/s40942-019-0187-6
