Anomalous Chemical Expansion Behavior of Pr[subscript 0.2]Ce[subscript 0.8]O[subscript 2-δ] Thin Films Grown by Pulsed Laser Deposition
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Tuller_Anomalous chemical.pdf
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Author(s)
Marrocchelli, Dario
Bishop, Sean
Yildiz, Bilge
Tuller, Harry L.
Kuru, Yener
Chen, Di
Date Issued
September 2012
Journal
Journal of the Electrochemical Society
Publisher
The Electrochemical Society
Citation
Kuru, Y., D. Marrocchelli, S. R. Bishop, D. Chen, B. Yildiz, and H. L. Tuller. “Anomalous Chemical Expansion Behavior of Pr0.2Ce0.8O2- Thin Films Grown by Pulsed Laser Deposition.” Journal of the Electrochemical Society 159, no. 11 (January 1, 2012): F799-F803. © 2012 The Electrochemical Society
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Final published version
Abstract
The chemomechanical and electrical properties of (Pr,Ce)O[subscript 2-δ] thin films were studied between 30 and 875°C in air by in situ X-ray diffraction and complex impedance spectroscopy measurements. Reduction/oxidation reactions produced large stress variations (∼2 GPa) in the structure. Atomistic simulation techniques were employed to investigate the mechanisms behind the observed chemical expansion behavior, suggesting the possible roles of defect ordering upon cooling and heating. An alternative explanation based on a metastable frozen in state of higher reduction is also considered. Similar phenonena, observed here in Pr[subscript 0.2]Ce[subscript 0.8]O[subscript 2-δ], are expected to be applicable and of potential significance for other technologically important complex oxides such as perovskite-structured materials.
MIT Department
Massachusetts Institute of Technology. Department of Materials Science and Engineering
Massachusetts Institute of Technology. Department of Nuclear Science and Engineering
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DOI of Published Version
https://doi.org/10.1149/2.016212jes
