X-ray imaging crystal spectroscopy for use in plasma transport research
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ReinkeXrayImagingRSI12.pdf
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Author(s) • • • • • • • • •
Bitter, M.
Delgado-Aparicio, Luis
Hill, K.
Pablant, N.
Reinke, Matthew Logan
Podpaly, Yuri
Rice, John E.
Gao, Chi
Greenwald, Martin J.
Howard, Nathaniel Thomas
Date Issued
November 2012
Journal
Review of Scientific Instruments
Publisher
American Institute of Physics (AIP)
Citation
Reinke, M. L., Y. A. Podpaly, M. Bitter, I. H. Hutchinson, J. E. Rice, L. Delgado-Aparicio, C. Gao, et al. “X-ray imaging crystal spectroscopy for use in plasma transport research.” Review of Scientific Instruments 83, no. 11 (2012): 113504. © 2012 American Institute of Physics
Version
Final published version
Abstract
This research describes advancements in the spectral analysis and error propagation techniques associated with x-ray imaging crystal spectroscopy (XICS) that have enabled this diagnostic to be used to accurately constrain particle, momentum, and heat transport studies in a tokamak for the first time. Dopplertomography techniques have been extended to include propagation of statistical uncertainty due to photon noise, the effect of non-uniform instrumental broadening as well as flux surface variations in impurity density. These methods have been deployed as a suite of modeling and analysis tools, written in interactive data language (IDL) and designed for general use on tokamaks. Its application to the Alcator C-Mod XICS is discussed, along with novel spectral and spatial calibration techniques. Example ion temperature and radial electric field profiles from recent I-mode plasmas are shown, and the impact of poloidally asymmetric impurity density and natural line broadening is discussed in the context of the planned ITER x-ray crystal spectrometer.
MIT Department
Massachusetts Institute of Technology. Department of Nuclear Science and Engineering
Massachusetts Institute of Technology. Plasma Science and Fusion Center
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Article is made available in accordance with the publisher's policy and may be subject to US copyright law. Please refer to the publisher's site for terms of use.
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DOI of Published Version
https://doi.org/10.1063/1.4758281