Hot-carrier reliability evaluation for CMOS devices and circuits
Name
32875610-MIT.pdf
Description
Full printable version
Size
5.57 MB
Format
Adobe PDF
Checksum (MD5)
7f9a44df2e60b56cc6a46361461f0dcb
Author(s)
Chan, Vei-Han
Advisor(s)
James E. Chung.
Date Issued
1995
Publisher
Massachusetts Institute of Technology
Description
Thesis (Ph. D.)--Massachusetts Institute of Technology, Dept. of Electrical Engineering and Computer Science, 1995.
Includes bibliographical references (p. 138-139).
Subjects
Electrical Engineering and Computer Science
MIT Department
Massachusetts Institute of Technology. Department of Electrical Engineering and Computer Science
Terms of Use
M.I.T. theses are protected by copyright. They may be viewed from this source for any purpose, but reproduction or distribution in any format is prohibited without written permission. See provided URL for inquiries about permission.
Persistent DSpace Link
