Finite-geometry models of electric field noise from patch potentials in ion traps
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Low-2011-Finite-geometry models of electric field noise.pdf
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Author(s)
Low, Guang Hao
Herskind, Peter F.
Chuang, Isaac L.
Date Issued
November 2011
Journal
Physical Review A
Publisher
American Physical Society (APS)
Citation
Low, Guang Hao, Peter Herskind, and Isaac Chuang. “Finite-geometry Models of Electric Field Noise from Patch Potentials in Ion Traps.” Physical Review A 84.5 (2011): n. pag. Web. 2 Mar. 2012. © 2011 American Physical Society
Version
Final published version
Abstract
We model electric field noise from fluctuating patch potentials on conducting surfaces by taking into account the finite geometry of the ion trap electrodes to gain insight into the origin of anomalous heating in ion traps. The scaling of anomalous heating rates with surface distance d is obtained for several generic geometries of relevance to current ion trap designs, ranging from planar to spheroidal electrodes. The influence of patch size is studied both by solving Laplace's equation in terms of the appropriate Green's function as well as through an eigenfunction expansion. Scaling with surface distance is found to be highly dependent on the choice of geometry and the relative scale between the spatial extent of the electrode, the ion-electrode distance, and the patch size. Our model generally supports the d[superscript −4] dependence currently found by most experiments and models, but also predicts geometry-driven deviations from this trend.
MIT Department
Massachusetts Institute of Technology. Department of Physics
Massachusetts Institute of Technology. Research Laboratory of Electronics
MIT-Harvard Center for Ultracold Atoms
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Article is made available in accordance with the publisher's policy and may be subject to US copyright law. Please refer to the publisher's site for terms of use.
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DOI of Published Version
https://doi.org/10.1103/PhysRevA.84.053425
