Repository logo
Log in(current)
Repository logoMIT Open ScholarshipDSpace@MIT
  1. Home
  2. MIT Libraries
  3. MIT Theses
  4. Graduate Theses
  5. Quality improvement and control based on defect reduction

Quality improvement and control based on defect reduction

Thumbnail Image
Download
Name

712179834-MIT.pdf

Description
Full printable version
Size

6.96 MB

Format

Adobe PDF

Checksum (MD5)

4adbc262608f4be311afb2128f11b529

Author(s)
Dai, Qi, M. Eng. Massachusetts Institute of Technology
Advisor(s)
David E. Hardt.
Date Issued
2010
Publisher
Massachusetts Institute of Technology
Abstract
This thesis addresses the quality improvement in a printing process at a food packaging company now experiencing hundreds of printing defects. Methodologies of Define, Measure, Analyze, Improve, and Control (DMAIC), and Response Surface Model were introduced to reduce the defect rate and control the process. As a result, critical inputs were identified, and a statistical regression model was constructed to predict the flaw size by knowing the critical inputs of the process. The mathematical optimal settings were determined to minimize the flaw size. Moreover, advanced control charts were developed to monitor and control the process.
Description
Thesis (M. Eng.)--Massachusetts Institute of Technology, Dept. of Mechanical Engineering, 2010.
Cataloged from PDF version of thesis.
Includes bibliographical references (p. 48-49).
Subjects
Mechanical Engineering.
MIT Department
Massachusetts Institute of Technology. Department of Mechanical Engineering
Terms of Use
M.I.T. theses are protected by
copyright. They may be viewed from this source for any purpose, but
reproduction or distribution in any format is prohibited without written
permission. See provided URL for inquiries about permission.
http://dspace.mit.edu/handle/1721.1/7582
Persistent DSpace Link
http://hdl.handle.net/1721.1/62497
Repository logo
PrivacyPermissionsAccessibilityContact us
Repository logo
Notify us about copyright concerns.