A framework for non-intrusive load monitoring and diagnostics
Name
83290088-MIT.pdf
Description
Full printable version
Size
15.03 MB
Format
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Checksum (MD5)
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Author(s)
Paris, James, Ph. D. Massachusetts Institute of Technology
Advisor(s)
Steven B. Leeb and Robert W. Cox.
Date Issued
2006
Publisher
Massachusetts Institute of Technology
Abstract
The widespread use of electrical and electromechanical systems places increasing demands on monitoring and diagnostic techniques. The non-intrusive load monitor (NILM) provides a low-cost, low-maintenance way to perform this monitoring and diagnostics from a centralized location. This work critically evaluates the current state of the NILM hardware and software in order to develop new techniques and a new hardware and software framework in which to better apply the NILM to real-world systems. New diagnostic indicators are developed on the USCGC SENECA using an improved hardware and software platform. A database-driven framework with the flexibility to create and implement these and future diagnostic indicators is presented.
Description
Thesis (M. Eng.)--Massachusetts Institute of Technology, Dept. of Electrical Engineering and Computer Science, 2006.
Includes bibliographical references (p. 259-260).
Subjects
Electrical Engineering and Computer Science.
MIT Department
Massachusetts Institute of Technology. Department of Electrical Engineering and Computer Science
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