Misfit accomodation in thin films of Ni/Cu as measured by magnetic anisotropy
Name
33328312-MIT.pdf
Description
Full printable version
Size
6.51 MB
Format
Adobe PDF
Checksum (MD5)
2c18d94b9f799a38a55092e83ea739d4
Author(s)
Inglefield, Heather Elizabeth
Advisor(s)
Carl V. Thompson.
Date Issued
1995
Publisher
Massachusetts Institute of Technology
Description
Thesis (Ph. D.)--Massachusetts Institute of Technology, Dept. of Materials Science and Engineering, 1995.
Includes bibliographical references (leaves 134-137).
Subjects
Materials Science and Engineering
MIT Department
Massachusetts Institute of Technology. Department of Materials Science and Engineering
Terms of Use
M.I.T. theses are protected by copyright. They may be viewed from this source for any purpose, but reproduction or distribution in any format is prohibited without written permission. See provided URL for inquiries about permission.
Persistent DSpace Link
