Repository logo
Log in(current)
Repository logoMIT Open ScholarshipDSpace@MIT
  1. Home
  2. MIT Open Access Articles
  3. MIT Open Access Articles
  4. Reliable widely tunable electrically pumped 1050nm MEMS-VCSELs with amplifier in single butterfly co-package

Reliable widely tunable electrically pumped 1050nm MEMS-VCSELs with amplifier in single butterfly co-package

Thumbnail Image
Download
Name

1122809.pdf

Description
Published version
Size

943.99 KB

Format

Adobe PDF

Checksum (MD5)

4571752fd767e28008a9d4d1602bc7d0

sword-2020-12-15T14:35:01.original.xml (130 B)
Original SWORD entry document
Author(s)
Potsaid, Benjamin M.
•
Carrasco-Zevellos, Oscar
•
Chen, Siyu
•
Moult, Eric Michael
•
Fujimoto, James G
Date Issued
March 2020
Journal
Progress in Biomedical Optics and Imaging - Proceedings of SPIE
Publisher
SPIE
Citation
Burgner, Christopher et al. “Reliable widely tunable electrically pumped 1050nm MEMS-VCSELs with amplifier in single butterfly co-package.” Progress in Biomedical Optics and Imaging - Proceedings of SPIE, 11228 (March 2020): 1122809 © 2020 The Author(s)
Version
Final published version
Abstract
We demonstrate the first 1050nm MEMS-eVCSEL co-packaged with a wideband amplifier to achieve over 70nm wavelength tuning at over 30mW of output power and SMSR greater than 40dB. Ophthalmic Optical Coherence Tomography Angiography (OCTA) images acquired at 800kHz A-scan rates showcase the telecom grade 14pin butterfly co-package as a path to low cost swept source OCT engines. Device design employs a strain-compensated InGaAs/GaAsP gain region disposed on a wideband fully oxidized GaAs/AlxOy back mirror capable of tuning ranges beyond 100nm. It has been suggested the wideband fully oxidized GaAs/AlxOy back mirror may pose risk to device lifetime reliability. However, over 9000hrs of lifetime testing validates reliability and projects device lifetimes exceed 20,000hrs under continuous use.
MIT Department
Massachusetts Institute of Technology. Research Laboratory of Electronics
Massachusetts Institute of Technology. Department of Electrical Engineering and Computer Science
Massachusetts Institute of Technology. Institute for Medical Engineering & Science
Terms of Use
Article is made available in accordance with the publisher's policy and may be subject to US copyright law. Please refer to the publisher's site for terms of use.
Persistent DSpace Link
https://hdl.handle.net/1721.1/129536
DOI of Published Version
https://doi.org/10.1117/12.2549050
Repository logo
PrivacyPermissionsAccessibilityContact us
Repository logo
Notify us about copyright concerns.