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Distance scaling of electric-field noise in a surface-electrode ion trap

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Author(s)
Sedlacek, Jonathon
•
Greene, Amy L
•
Stuart, J. Scott
•
McConnell, Robert P.
•
Bruzewicz, Colin D.
•
Sage, Jeremy M.
•
Chiaverini, John
Date Issued
February 2018
Journal
Physical Review A
Publisher
American Physical Society
Citation
Sedlacek, J. A. et al. "Distance scaling of electric-field noise in a surface-electrode ion trap." Physical Review A 97, 2 (February 2018): 020302(R) © 2018 American Physical Society
Version
Final published version
Abstract
We investigate anomalous ion-motional heating, a limitation to multiqubit quantum-logic gate fidelity in trapped-ion systems, as a function of ion-electrode separation. Using a multizone surface-electrode trap in which ions can be held at five discrete distances from the metal electrodes, we measure power-law dependencies of the electric-field noise experienced by the ion on the ion-electrode distance d. We find a scaling of approximately d^{−4} regardless of whether the electrodes are at room temperature or cryogenic temperature, despite the fact that the heating rates are approximately two orders of magnitude smaller in the latter case. Through auxiliary measurements using the application of noise to the electrodes, we rule out technical limitations to the measured heating rates and scalings. We also measure the frequency scaling of the inherent electric-field noise close to 1/f at both temperatures. These measurements eliminate from consideration anomalous-heating models which do not have a d⁻⁴ distance dependence, including several microscopic models of current interest.
MIT Department
Lincoln Laboratory
Massachusetts Institute of Technology. Department of Electrical Engineering and Computer Science
Massachusetts Institute of Technology. Department of Physics
Terms of Use
Article is made available in accordance with the publisher's policy and may be subject to US copyright law. Please refer to the publisher's site for terms of use.
Persistent DSpace Link
http://hdl.handle.net/1721.1/114395
DOI of Published Version
https://doi.org/10.1103/PhysRevA.97.020302
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