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Research Laboratory for Electronics (RLE)
RLE Progress Reports
RLE Progress Report, No. 128 (1986)
Ultralow Temperature Studies of Electronic Conduction in Submicron Silicon Inversion Layers
Ultralow Temperature Studies of Electronic Conduction in Submicron Silicon Inversion Layers
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Name
RLE_PR_128_11.pdf
Size
99.22 KB
Format
Adobe PDF
Checksum
(MD5)
a07b045a91e8ae983c3734ba1a2ceb93
Author(s)
Kastner, Marc A.
Date Issued
January 1986
Publisher
Research Laboratory of Electronics (RLE) at the Massachusetts Institute of Technology (MIT)
Series/Report no.
Massachusetts Institute of Technology. Research Laboratory of Electronics. Progress Report, no. 128
Description
Contains research summary.
Terms of Use
Copyright (c) 2008 by the Massachusetts Institute of Technology. All rights reserved.
Persistent DSpace Link
http://hdl.handle.net/1721.1/56957
