Design tool and methodologies for interconnect reliability analysis in integrated circuits
Name
59553725-MIT.pdf
Description
Full printable version
Size
3.11 MB
Format
Adobe PDF
Checksum (MD5)
6b119488a995e839b56223b4672a9c9b
Author(s)
Alam, Syed Mohiul, 1975-
Advisor(s)
Donald E. Troxel and Carl V. Thompson.
Date Issued
2004
Publisher
Massachusetts Institute of Technology
Description
Thesis (Ph. D.)--Massachusetts Institute of Technology, Dept. of Electrical Engineering and Computer Science, 2004.
This electronic version was submitted by the student author. The certified thesis is available in the Institute Archives and Special Collections.
Includes bibliographical references (p. 195-204).
Subjects
Electrical Engineering and Computer Science.
MIT Department
Massachusetts Institute of Technology. Department of Electrical Engineering and Computer Science
Terms of Use
M.I.T. theses are protected by copyright. They may be viewed from this source for any purpose, but reproduction or distribution in any format is prohibited without written permission. See provided URL for inquiries about permission.
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