Monitoring Defect Formation in Colloidal Self Assembly using Photonic Bandgap Variations
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AMMNS009.pdf
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536.39 KB
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Checksum (MD5)
766e596f11f217b86028e6d036fcb218
Author(s)
Koh, Yaw Koon
Wong, Chee Cheong
Date Issued
January 2006
Series/Report no.
Advanced Materials for Micro- and Nano-Systems (AMMNS)
Abstract
Defect control in colloidal crystals is essential for these nanostructures to be effective as photonic bandgap (PBG) materials. We have used in-situ monitoring of the PBG of a colloidal crystal to study the structural changes during colloidal self assembly, with a focus on the formation of macroscopic defects such as cracks. These findings allow us to model the final stages of colloidal self assembly and explain the formation of growth defects in colloidal crystal. Our model suggests that cracks are intrinsic to self assembly growth methods. . However, by tuning the interaction potential between the colloids, it is possible to minimize the cracks in colloidal crystals.
Subjects
colloid
defects
Photonic bandgap
Self assembly
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