Investigation of noise sources in scaled CMOS field-effect transistors
Name
51490746-MIT.pdf
Description
Full printable version
Size
8.04 MB
Format
Adobe PDF
Checksum (MD5)
96ccd4f98995c25bb8a1529ddcf41fd9
Author(s)
Sepke, Todd C. (Todd Christopher), 1975-
Advisor(s)
Hae-Seung Lee and Charles G. Sodini.
Alternative Title
Investigation of noise sources in scaled complementary metal oxide semiconductors field-effect transistors
Date Issued
2002
Publisher
Massachusetts Institute of Technology
Description
Thesis (S.M.)--Massachusetts Institute of Technology, Dept. of Electrical Engineering and Computer Science, 2002.
MIT Institute Archives hard copy: p. 101-102 bound 102-101; p. 102 blank.
Includes bibliographical references (p. 97-101).
Subjects
Electrical Engineering and Computer Science.
MIT Department
Massachusetts Institute of Technology. Department of Electrical Engineering and Computer Science
Terms of Use
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