Uncertainty quantification for integrated circuits: Stochastic spectral methods
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8. iccad 2013.pdf
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Author(s)
Zhang, Zheng
Elfadel, Ibrahim Abe M.
Daniel, Luca
Date Issued
November 2013
Journal
Proceedings of the 2013 IEEE/ACM International Conference on Computer-Aided Design (ICCAD)
Publisher
Institute of Electrical and Electronics Engineers (IEEE)
Citation
Zhang, Zheng, Ibrahim Abe M. Elfadel, and Luca Daniel. “Uncertainty Quantification for Integrated Circuits: Stochastic Spectral Methods.” 2013 IEEE/ACM International Conference on Computer-Aided Design (ICCAD), 18-23 November 2013, San Jose, CA, USA, IEEE, 2013.
Version
Author's final manuscript
Abstract
Due to significant manufacturing process variations, the performance of integrated circuits (ICs) has become increasingly uncertain. Such uncertainties must be carefully quantified with efficient stochastic circuit simulators. This paper discusses the recent advances of stochastic spectral circuit simulators based on generalized polynomial chaos (gPC). Such techniques can handle both Gaussian and non-Gaussian random parameters, showing remarkable speedup over Monte Carlo for circuits with a small or medium number of parameters. We focus on the recently
developed stochastic testing and the application of conventional
stochastic Galerkin and stochastic collocation schemes to nonlinear
circuit problems. The uncertainty quantification algorithms for static, transient and periodic steady-state simulations are presented along with some practical simulation results. Some open problems in this field are discussed.
MIT Department
Massachusetts Institute of Technology. Research Laboratory of Electronics
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DOI of Published Version
https://doi.org/10.1109/ICCAD.2013.6691205
