Spatial yield modeling for semiconductor wafers
Name
33228512-MIT.pdf
Description
Full printable version
Size
5.66 MB
Format
Adobe PDF
Checksum (MD5)
e79e0e9c8a0b209c0c8a2bd9b97f8229
Author(s)
Mirza, Agha Irtaza
Advisor(s)
Alvin W. Drake.
Date Issued
1995
Publisher
Massachusetts Institute of Technology
Description
Thesis (M.S.)--Massachusetts Institute of Technology, Dept. of Electrical Engineering and Computer Science, 1995.
Includes bibliographical references (p. 123-124).
Subjects
Electrical Engineering and Computer Science
MIT Department
Massachusetts Institute of Technology. Department of Electrical Engineering and Computer Science
Terms of Use
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