Functional testing of ASICs designed with hardware description languages
Name
33356283-MIT.pdf
Description
Full printable version
Size
4.52 MB
Format
Adobe PDF
Checksum (MD5)
561f9279b6389145f75cb60740b6b45e
Author(s)
Davis, Richard Christopher
Advisor(s)
G. Andrew Boughton.
Date Issued
1995
Publisher
Massachusetts Institute of Technology
Description
Thesis (M. Eng.)--Massachusetts Institute of Technology, Dept. of Electrical Engineering and Computer Science, 1995.
Includes bibliographical references (p. 99).
Subjects
Electrical Engineering and Computer Science
MIT Department
Massachusetts Institute of Technology. Department of Electrical Engineering and Computer Science
Terms of Use
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