Inertial measurement with trapped particles: A microdynamical system
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Gershenfeld_Inertial measurement.pdf
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Author(s)
Post, E. Rehmi
Popescu, Gabriel
Gershenfeld, Neil A
Date Issued
April 2010
Journal
Applied Physics Letters
Publisher
American Institute of Physics
Citation
Post, E. Rehmi, George A. Popescu, and Neil Gershenfeld. “Inertial measurement with trapped particles: A microdynamical system.” Applied Physics Letters 96 (2010): 143501. © 2010 American Institute of Physics.
Version
Final published version
Abstract
We describe an inertial measurement device based on an electrodynamically trapped proof
mass. Mechanical constraints are replaced by guiding fields, permitting the trap stiffness to be tuned
dynamically. Optical readout of the proof mass motion provides a measurement of acceleration
and rotation, resulting in an integrated six degree of freedom inertial measurement device.
We demonstrate such a device—constructed without microfabrication—with sensitivity
comparable to that of commercial microelectromechanical systems technology and show how
trapping parameters may be adjusted to increase dynamic range.
MIT Department
Massachusetts Institute of Technology. Center for Bits and Atoms
Massachusetts Institute of Technology. Media Laboratory
Massachusetts Institute of Technology. Spectroscopy Laboratory
Program in Media Arts and Sciences (Massachusetts Institute of Technology)
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Article is made available in accordance with the publisher's policy and may be subject to US copyright law. Please refer to the publisher's site for terms of use.
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DOI of Published Version
https://doi.org/10.1063/1.3360808
