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Dielectric spectroscopic investigation of reversible photo-induced changes in amorphous Ge<sub>2</sub>Sb<sub>2</sub>Se<sub>5</sub> thin films

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Dielectric spectroscopic investigation of reversible photo-induced changes in amorphous Ge2Sb2Se5 thin films.pdf

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sword-2022-05-20T17:14:51.original.xml (130 B)
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Author(s)
Obeng, Yaw S
•
Nguyen, Nhan V
•
Amoah, Papa K
•
Ahn, Jungjoon
•
Shalaginov, Mikhail Y
•
Hu, Juejun
•
Richardson, Kathleen A
Date Issued
February 21, 2022
Journal
Journal of Applied Physics
Publisher
AIP Publishing
Citation
Obeng, Yaw S, Nguyen, Nhan V, Amoah, Papa K, Ahn, Jungjoon, Shalaginov, Mikhail Y et al. 2022. "Dielectric spectroscopic investigation of reversible photo-induced changes in amorphous Ge2Sb2Se5 thin films." Journal of Applied Physics, 131 (7).
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Final published version
MIT Department
Massachusetts Institute of Technology. Department of Materials Science and Engineering
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Article is made available in accordance with the publisher's policy and may be subject to US copyright law. Please refer to the publisher's site for terms of use.
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DOI of Published Version
https://doi.org/10.1063/5.0080142
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