Physical redundancy for defect tolerance : example designs and fundamental limits
Name
940982539-MIT.pdf
Description
Full printable version
Size
4.62 MB
Format
Adobe PDF
Checksum (MD5)
52a9dfa58493c5350ba5ec8127d1bb8c
Author(s)
Tang, Jennifer (Jennifer Susan)
Advisor(s)
Yury Polyanskiy.
Date Issued
2015
Publisher
Massachusetts Institute of Technology
Abstract
This project analyzes designs for physical redundancy which are modeled abstractly as a bipartite graph. The goal is to determine the characteristics of graph structures which optimize the trade-off between the number of edges and the number of redundant components or nodes needed while correcting a deterministic number of worst-case errors. This thesis looks at finite-sized designs, asymptotically large designs with finite error correcting values, and designs with asymptotically large error correcting values. Results include some small optimal graph structures and fundamental limits on what the optimal design structure can achieve for the cases where a small number of errors are corrected and for where the number of errors to be correctly grows asymptotically.
Description
Thesis: S.M., Massachusetts Institute of Technology, Department of Electrical Engineering and Computer Science, 2015.
Cataloged from PDF version of thesis.
Includes bibliographical references (page 75).
Subjects
Electrical Engineering and Computer Science.
MIT Department
Massachusetts Institute of Technology. Department of Electrical Engineering and Computer Science
Terms of Use
M.I.T. theses are protected by copyright. They may be viewed from this source for any purpose, but reproduction or distribution in any format is prohibited without written permission. See provided URL for inquiries about permission.
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