Rate-Dependent Nucleation and Growth of NaO[subscript 2] in Na-O[subscript 2] Batteries
Author(s)
Ortiz Vitoriano, Nagore
Batcho, Thomas Peter
Kwabi, David Gator
Han, Binghong
Pour, Nir
Yao, Koffi Pierre Claver
Thompson, Carl Vernette
Shao-Horn, Yang
Alternative Title
Rate-Dependent Nucleation and Growth of NaO2 in Na-O2 Batteries
Date Issued
June 2015
Journal
Journal of Physical Chemistry Letters
Publisher
American Chemical Society (ACS)
Citation
Ortiz-Vitoriano, Nagore, Thomas P. Batcho, David G. Kwabi, Binghong Han, Nir Pour, Koffi Pierre Claver Yao, Carl V. Thompson, and Yang Shao-Horn. "Rate-Dependent Nucleation and Growth of NaO[subscript 2] in Na-O[subscript 2] Batteries." Journal of Physical Chemistry Letters 6:13 (June 2015), pp.2636-2643.
Abstract
Understanding the oxygen reduction reaction kinetics in the presence of Na ions and the formation mechanism of discharge product(s) is key to enhancing Na–O2 battery performance. Here we show NaO2 as the only discharge product from Na–O2 cells with carbon nanotubes in 1,2-dimethoxyethane from X-ray diffraction and Raman spectroscopy. Sodium peroxide dihydrate was not detected in the discharged electrode with up to 6000 ppm of H2O added to the electrolyte, but it was detected with ambient air exposure. In addition, we show that the sizes and distributions of NaO2 can be highly dependent on the discharge rate, and we discuss the formation mechanisms responsible for this rate dependence. Micron-sized (∼500 nm) and nanometer-scale (∼50 nm) cubes were found on the top and bottom of a carbon nanotube (CNT) carpet electrode and along CNT sidewalls at 10 mA/g, while only micron-scale cubes (∼2 μm) were found on the top and bottom of the CNT carpet at 1000 mA/g, respectively.
MIT Department
Massachusetts Institute of Technology. Department of Materials Science and Engineering
Massachusetts Institute of Technology. Department of Mechanical Engineering
Massachusetts Institute of Technology. Electrochemical Energy Laboratory
Massachusetts Institute of Technology. Research Laboratory of Electronics
Terms of Use
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Persistent DSpace Link
DOI of Published Version
https://doi.org/10.1021/acs.jpclett.5b00919
