Impact of DC bias on weak optical-field-driven electron emission in nano-vacuum-gap detectors
Name
2011.00625.pdf
Description
Submitted version
Size
973.54 KB
Format
Adobe PDF
Checksum (MD5)
35eb81b73c4f7511f809216acbad2b50
Author(s)
Turchetti, Marco
Bionta, Mina R
Yang, Yujia
Ritzkowsky, Felix
Candido, Denis R
Flatté, Michael E
Berggren, Karl K
Keathley, Phillip D
Date Issued
2021
Journal
Journal of the Optical Society of America B: Optical Physics
Publisher
The Optical Society
Citation
Turchetti, Marco, Bionta, Mina R, Yang, Yujia, Ritzkowsky, Felix, Candido, Denis R et al. 2021. "Impact of DC bias on weak optical-field-driven electron emission in nano-vacuum-gap detectors." Journal of the Optical Society of America B: Optical Physics, 38 (3).
Version
Original manuscript
MIT Department
Massachusetts Institute of Technology. Research Laboratory of Electronics
Terms of Use
Creative Commons Attribution-NonCommercial-ShareAlike 4.0 International
Persistent DSpace Link
DOI of Published Version
https://doi.org/10.1364/JOSAB.413680
