Critical-current reduction in thin superconducting wires due to current crowding
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Berggren_Critical-current.pdf
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851.23 KB
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Author(s)
Berggren, Karl K.
Hortensius, H. L.
Driessen, E. F. C.
Klapwijk, T. M.
Clem, John R.
Date Issued
May 2012
Journal
Applied Physics Letter
Publisher
American Institute of Physics (AIP)
Citation
Hortensius, H. L. et al. “Critical-Current Reduction in Thin Superconducting Wires due to Current Crowding.” Applied Physics Letters 100.18 (2012): 182602.
Version
Author's final manuscript
Abstract
We demonstrate experimentally that the critical current in superconducting NbTiN wires is dependent on their geometrical shape, due to current-crowding effects. Geometric patterns such as 90˚ corners and sudden expansions of wire width are shown to result in the reduction of critical currents. The results are relevant for single-photon detectors as well as parametric amplifiers.
MIT Department
Massachusetts Institute of Technology. Department of Electrical Engineering and Computer Science
Massachusetts Institute of Technology. Research Laboratory of Electronics
Persistent DSpace Link
DOI of Published Version
https://doi.org/10.1063/1.4711217
