Synergistic effects of anisotropy and image force on TEM diffraction contrast of dislocation loops
Name
10.1111-jmi.12884.pdf
Size
2.4 MB
Format
Unknown
Checksum (MD5)
837cb8dfa9735ab9face78df5ba44806
Author(s)
WU, W.
SCHÄUBLIN, R.
Date Issued
April 2020
Journal
Journal of Microscopy
Publisher
Wiley
Citation
WU, W. and SCHÄUBLIN, R. 2020. "Synergistic effects of anisotropy and image force on TEM diffraction contrast of dislocation loops." Journal of Microscopy, 278 (1).
Version
Author's final manuscript
MIT Department
Massachusetts Institute of Technology. Department of Mechanical Engineering
Terms of Use
Article is made available in accordance with the publisher's policy and may be subject to US copyright law. Please refer to the publisher's site for terms of use.
Persistent DSpace Link
DOI of Published Version
https://doi.org/10.1111/jmi.12884
