A low dispersion 2-GHz comparator
Name
79476900-MIT.pdf
Description
Full printable version
Size
3.21 MB
Format
Adobe PDF
Checksum (MD5)
f7dd6111b227aeed6fef4d7609d2ddd7
Author(s)
Johnston, William F. (William Francis)
Advisor(s)
Allan Parks and James K. Roberge.
Alternative Title
Low dispersion two-gigahertz comparator
Date Issued
2001
Publisher
Massachusetts Institute of Technology
Abstract
A low dispersion 2-GHz comparator is an essential part of the latest automated VLSI tester by Teradyne Inc. With each new and faster CMOS logic VLSI microchips, faster and more precise comparators are needed to verify that the static discipline is being met on the many pins of the integrated circuit. As the error in the comparator is lowered, the VLSI production yield is greatly increased because of greater certainty of the measurements. The comparator described within is designed to test a variety of CMOS logic levels at the expected logic levels and rise-times of the near future. The result is a Si-Ge integrated comparator with 12psec of dispersion by detailed simulation awaiting fabrication. Index Terms-Complementary metal oxide semiconductor transistor technology (CMOS technology), very large scale integration (VLSI), application specific integrated circuit (ASIC), silicon germanium (Si-Ge), integrated circuits (IC), automatic test equipment (ATE), personal computer (PC), digital signal processing (DSP), direct current (DC), alternating current (AC), device under test (DUT), pin electronics (PE), bipolar junction transistors (BJT), complementary metal oxide semiconductor field effect transistor (MOSFET).
Description
Thesis (M. Eng. and S.B.)--Massachusetts Institute of Technology, Dept. of Electrical Engineering and Computer Science, 2001.
Includes bibliographical references (leaves 40-41).
Subjects
Electrical Engineering and Computer Science.
MIT Department
Massachusetts Institute of Technology. Department of Electrical Engineering and Computer Science
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