Design of radiation resistant metallic multilayers for advanced nuclear systems
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APL_104_241906.pdf
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1.34 MB
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Checksum (MD5)
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Author(s)
Zhernenkov, Mikhail
Gill, Simerjeet
Stanic, Vesna
DiMasi, Elaine
Kisslinger, Kim
Baldwin, J. Kevin
Misra, Amit
Ecker, Lynne
Demkowicz, Michael J.
Date Issued
May 2014
Journal
Applied Physics Letters
Publisher
American Institute of Physics (AIP)
Citation
Zhernenkov, Mikhail, Simerjeet Gill, Vesna Stanic, Elaine DiMasi, Kim Kisslinger, J. Kevin Baldwin, Amit Misra, M. J. Demkowicz, and Lynne Ecker. “Design of Radiation Resistant Metallic Multilayers for Advanced Nuclear Systems.” Appl. Phys. Lett. 104, no. 24 (June 16, 2014): 241906. © 2014 AIP Publishing LLC
Version
Final published version
Abstract
Helium implantation from transmutation reactions is a major cause of embrittlement and dimensional instability of structural components in nuclear energy systems. Development of novel materials with improved radiation resistance, which is of the utmost importance for progress in nuclear energy, requires guidelines to arrive at favorable parameters more efficiently. Here, we present a methodology that can be used for the design of radiation tolerant materials. We used synchrotron X-ray reflectivity to nondestructively study radiation effects at buried interfaces and measure swelling induced by He implantation in Cu/Nb multilayers. The results, supported by transmission electron microscopy, show a direct correlation between reduced swelling in nanoscale multilayers and increased interface area per unit volume, consistent with helium storage in Cu/Nb interfaces in forms that minimize dimensional changes. In addition, for Cu/Nb layers, a linear relationship is demonstrated between the measured depth-dependent swelling and implanted He density from simulations, making the reflectivity technique a powerful tool for heuristic material design.
MIT Department
Massachusetts Institute of Technology. Department of Materials Science and Engineering
Terms of Use
Article is made available in accordance with the publisher's policy and may be subject to US copyright law. Please refer to the publisher's site for terms of use.
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DOI of Published Version
https://doi.org/10.1063/1.4883481
