A ring oscillator based variation test chip
Name
51589231-MIT.pdf
Description
Full printable version
Size
23.22 MB
Format
Adobe PDF
Checksum (MD5)
e9cfe5019167f0217fee55b979ac0656
Author(s)
Panganiban, Joseph Sinohin, 1979-
Advisor(s)
Duane S. Boning.
Date Issued
2002
Publisher
Massachusetts Institute of Technology
Description
Thesis (M.Eng.)--Massachusetts Institute of Technology, Dept. of Electrical Engineering and Computer Science, 2002.
Includes bibliographical references (p. 161-162).
Subjects
Electrical Engineering and Computer Science.
MIT Department
Massachusetts Institute of Technology. Department of Electrical Engineering and Computer Science
Terms of Use
M.I.T. theses are protected by copyright. They may be viewed from this source for any purpose, but reproduction or distribution in any format is prohibited without written permission. See provided URL for inquiries about permission.
Persistent DSpace Link
