Reliable InP-based Geiger-mode Avalanche Photodiode Arrays
Name
Smith-2009-Reliable InP-based geiger-mode avalanche photodiode arrays.pdf
Size
4.19 MB
Format
Adobe PDF
Checksum (MD5)
00afd7b225f794613a5919b38a758008
Author(s)
Smith, Gary M.
McIntosh, K. Alexander
Donnelly, Joseph P.
Funk, Joseph E.
Mahoney, Leonard J.
Verghese, Simon
Date Issued
April 2009
Journal
Proceedings of SPIE--the International Society for Optical Engineering
Publisher
Society of Photo-optical Instrumentation Engineers
Citation
Smith, Gary M. et al. “Reliable InP-based Geiger-mode avalanche photodiode arrays.” Advanced Photon Counting Techniques III. Ed. Mark A. Itzler & Joe C. Campbell. Orlando, FL, USA: SPIE, 2009. 73200R-10. © 2009 SPIE
Version
Final published version
Abstract
Arrays as large as 256 x 64 of single-photon counting avalanche photodiodes have been developed for defense applications in free-space communication and laser radar. Focal plane arrays (FPAs) sensitive to both 1.06 and 1.55 µm wavelength have been fabricated for these applications. At 240 K and 4 V overbias, the dark count rate (DCR) of 15 µm diameter devices is typically 250 Hz for 1.06 µm sensitive APDs and 1 kHz for 1.55 µm APDs. Photon detection efficiencies (PDE) at 4 V overbias are about 45% for both types of APDs. Accounting for microlens losses, the full FPA has a PDE of 30%. The reset time needed for a pixel to avoid afterpulsing at 240 K is about 3-4 µsec. These devices have been used by system groups at Lincoln Laboratory and other defense contractors for building operational systems. For these fielded systems the device reliability is a strong concern. Individual APDs as well as full arrays have been run for over 1000 hrs of accelerated testing to verify their stability. The reliability of these GM-APDs is shown to be under 10 FITs at operating temperatures of 250 K, which also corresponds to an MTTF of 17,100 yrs.
MIT Department
Lincoln Laboratory
Terms of Use
Article is made available in accordance with the publisher's policy and may be subject to US copyright law. Please refer to the publisher's site for terms of use.
Persistent DSpace Link
DOI of Published Version
http://dx.doi.org/10.1117/12.819126
