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  4. High-Responsivity Graphene–Boron Nitride Photodetector and Autocorrelator in a Silicon Photonic Integrated Circuit

High-Responsivity Graphene–Boron Nitride Photodetector and Autocorrelator in a Silicon Photonic Integrated Circuit

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Author(s)
Gao, Yuanda
•
Robertson, Alexander D.
•
Assefa, Solomon
•
Koppens, Frank H. L.
•
Hone, James
•
Shiue, Ren-Jye
•
Wang, Yifei
•
Peng, Cheng
•
Efetov, Dmitri
•
Englund, Dirk R.
Date Issued
November 2015
Journal
Nano Letters
Publisher
American Chemical Society (ACS)
Citation
Shiue, Ren-Jye et al. “High-Responsivity Graphene–Boron Nitride Photodetector and Autocorrelator in a Silicon Photonic Integrated Circuit.” Nano Letters 15, 11 (October 2015): 7288–7293 © 2015 American Chemical Society
Version
Author's final manuscript
Abstract
Graphene and other two-dimensional (2D) materials have emerged as promising materials for broadband and ultrafast photodetection and optical modulation. These optoelectronic capabilities can augment complementary metal-oxide-semiconductor (CMOS) devices for high-speed and low-power optical interconnects. Here, we demonstrate an on-chip ultrafast photodetector based on a two-dimensional heterostructure consisting of high-quality graphene encapsulated in hexagonal boron nitride. Coupled to the optical mode of a silicon waveguide, this 2D heterostructure-based photodetector exhibits a maximum responsivity of 0.36 A/W and high-speed operation with a 3 dB cutoff at 42 GHz. From photocurrent measurements as a function of the top-gate and source-drain voltages, we conclude that the photoresponse is consistent with hot electron mediated effects. At moderate peak powers above 50 mW, we observe a saturating photocurrent consistent with the mechanisms of electron-phonon supercollision cooling. This nonlinear photoresponse enables optical on-chip autocorrelation measurements with picosecond-scale timing resolution and exceptionally low peak powers. Keywords: autocorrelators; boron nitride; graphene; optoelectronics; photodetectors; silicon photonics
MIT Department
Massachusetts Institute of Technology. Department of Electrical Engineering and Computer Science
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Article is made available in accordance with the publisher's policy and may be subject to US copyright law. Please refer to the publisher's site for terms of use.
Persistent DSpace Link
http://hdl.handle.net/1721.1/117761
DOI of Published Version
https://doi.org/10.1021/ACS.NANOLETT.5B02368
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