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Deadlock-free fine-grained thread migration

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Author(s)
Cho, Myong Hyon
•
Shim, Keun Sup
•
Khan, Omer
•
Devadas, Srinivas
Date Issued
May 2011
Journal
Proceedings of the Fifth ACM/IEEE International Symposium on Networks-on-Chip (NOCS '11)
Publisher
Institute of Electrical and Electronics Engineers (IEEE)
Citation
Myong Hyon Cho, Keun Sup Shim, Mieszko Lis, Omer Khan, and Srinivas Devadas. 2011. Deadlock-free fine-grained thread migration. In Proceedings of the Fifth ACM/IEEE International Symposium on Networks-on-Chip (NOCS '11). ACM, New York, NY, USA, 33-40.
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Author's final manuscript
Abstract
Several recent studies have proposed fine-grained, hardware-level thread migration in multicores as a solution to power, reliability, and memory coherence problems. The need for fast thread migration has been well documented, however, a fast, deadlock-free migration protocol is sorely lacking: existing solutions either deadlock or are too slow and cumbersome to ensure performance with frequent, fine-grained thread migrations. In this study, we introduce the Exclusive Native Context (ENC) protocol, a general, provably deadlock-free migration protocol for instruction-level thread migration architectures. Simple to implement, ENC does not require additional hardware beyond common migration-based architectures. Our evaluation using synthetic migrations and the SPLASH-2 application suite shows that ENC offers performance within 11.7% of an idealized deadlock-free migration protocol with infinite resources.
MIT Department
Massachusetts Institute of Technology. Computer Science and Artificial Intelligence Laboratory
Massachusetts Institute of Technology. Department of Electrical Engineering and Computer Science
Terms of Use
Creative Commons Attribution-Noncommercial-Share Alike 3.0
http://creativecommons.org/licenses/by-nc-sa/3.0/
Persistent DSpace Link
http://hdl.handle.net/1721.1/72592
DOI of Published Version
https://doi.org/10.1145/1999946.1999952
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