Deposition parameters and Raman crystal orientation measurements of ceria thin films deposited by spray pyrolysis
Name
d1ta09115h.pdf
Description
Published version
Size
1.54 MB
Format
Unknown
Checksum (MD5)
0b08e47f6c7d32fda0af344921e9b59e
Author(s)
Simons, Philipp
Torres, Kierstin P.
Rupp, Jennifer L. M.
Date Issued
April 2022
Journal
Journal of Materials Chemistry A
Publisher
Royal Society of Chemistry (RSC)
Citation
Simons, Philipp, Torres, Kierstin P and Rupp, Jennifer LM. 2022. "Deposition parameters and Raman crystal orientation measurements of ceria thin films deposited by spray pyrolysis." Journal of Materials Chemistry A, 10 (16).
Version
Final published version
Abstract
Ceria thin films deposited by spray pyrolysis show a strong preferential 〈200〉 orientation after annealing corresponding to the {100} facet of high catalytic activity. This texture correlates with an unusually strong blue shift of the Raman F2g peak.
MIT Department
Massachusetts Institute of Technology. Department of Materials Science and Engineering
Massachusetts Institute of Technology. Department of Electrical Engineering and Computer Science
Terms of Use
Creative Commons Attribution-Noncommercial
Persistent DSpace Link
DOI of Published Version
https://doi.org/10.1039/d1ta09115h
