Electron beam techniques for testing and restructuring of wafer-scale integrated circuits
Name
08260000-MIT.pdf
Size
48.35 MB
Format
Adobe PDF
Checksum (MD5)
a27ea77d2e5d64d3096c3333535a4f5d
Author(s)
Shaver, David Carl.
Advisor(s)
Henry I. Smith.
Date Issued
1981
Publisher
Massachusetts Institute of Technology
Description
Thesis: Ph. D., Massachusetts Institute of Technology, Department of Electrical Engineering and Computer Science, 1981
Includes bibliographical references.
Subjects
Electrical Engineering and Computer Science.
MIT Department
Massachusetts Institute of Technology. Department of Electrical Engineering and Computer Science
Terms of Use
MIT theses may be protected by copyright. Please reuse MIT thesis content according to the MIT Libraries Permissions Policy, which is available through the URL provided.
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