A method for infrared temperature measurements of thin film materials with a low, unknown, and/or variable emissivity at low temperatures
Name
867866751-MIT.pdf
Description
Full printable version
Size
7.28 MB
Format
Adobe PDF
Checksum (MD5)
24660ceae382a6dee28ba044a843cde6
Author(s)
Jarboe, Jason Neal
Advisor(s)
Alexander H. Slocum.
Date Issued
2013
Publisher
Massachusetts Institute of Technology
Abstract
Accurate non-contact temperature measurements of objects using thermal radiation is often limited by low emission of IR radiation because of low temperatures and/or emissivities, or by the unknown or changing emissivity of the material being measured. This thesis covers an effort to build a practical, inexpensive, and widely applicable non-contact system for accurately measuring the temperatures of materials of low, unknown, and/or variable emissivity. The method to be used is intended specifically for those objects at low temperatures (below 100 degrees Celsius), which are conventionally the most difficult to accurately measure.
Description
Thesis (S.B.)--Massachusetts Institute of Technology, Dept. of Mechanical Engineering, 2013.
Cataloged from PDF version of thesis.
Includes bibliographical references.
Subjects
Mechanical Engineering.
MIT Department
Massachusetts Institute of Technology. Department of Mechanical Engineering
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reproduction or distribution in any format is prohibited without written
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