AutoOD: Automatic Outlier Detection
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3588700.pdf
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794.06 KB
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Author(s) • • • •
Cao, Lei
Yan, Yizhou
Wang, Yu
Madden, Samuel
Rundensteiner, Elke
Date Issued
May 30, 2023
Journal
Proceedings of the ACM on Management of Data
Publisher
ACM
Citation
Cao, Lei, Yan, Yizhou, Wang, Yu, Madden, Samuel and Rundensteiner, Elke. 2023. "AutoOD: Automatic Outlier Detection." Proceedings of the ACM on Management of Data, 1 (1).
Version
Final published version
MIT Department
Massachusetts Institute of Technology. Computer Science and Artificial Intelligence Laboratory
Terms of Use
Creative Commons Attribution
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DOI of Published Version
https://doi.org/10.1145/3588700