Extraction of MOSFET doping profiles from device electrical measurements
Name
38551563-MIT.pdf
Description
Full printable version
Size
5.69 MB
Format
Adobe PDF
Checksum (MD5)
a45115d0b9446c00fce6a03b1171f6d6
Author(s)
Rahman, Nadir E. (Nadir Ehsanur), 1971-
Advisor(s)
Michael McIlrath.
Date Issued
1996
Publisher
Massachusetts Institute of Technology
Description
Thesis (M. Eng.)--Massachusetts Institute of Technology, Dept. of Electrical Engineering and Computer Science, 1996.
Includes bibliographical references (leaves 84-88).
Subjects
Electrical Engineering and Computer Science
MIT Department
Massachusetts Institute of Technology. Department of Electrical Engineering and Computer Science
Terms of Use
M.I.T. theses are protected by copyright. They may be viewed from this source for any purpose, but reproduction or distribution in any format is prohibited without written permission. See provided URL for inquiries about permission.
Persistent DSpace Link
