Test and diagnosis of microprocessor memory arrays using functional patterns
Name
35332914-MIT.pdf
Description
Full printable version
Size
19.01 MB
Format
Adobe PDF
Checksum (MD5)
24a1f1f16e3bc2b9cab99bfae1fca8a8
Author(s)
Lai, Ya-Chieh
Advisor(s)
Srinivas Devadas.
Date Issued
1996
Publisher
Massachusetts Institute of Technology
Description
Thesis (M. Eng.)--Massachusetts Institute of Technology, Dept. of Electrical Engineering and Computer Science, 1996.
Includes bibliographical references (p. 101).
Subjects
Electrical Engineering and Computer Science
MIT Department
Massachusetts Institute of Technology. Department of Electrical Engineering and Computer Science
Terms of Use
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