Procedure for optimal D.C. parameter extraction for hot-carrier degradation model calibration and verification
Name
39134657-MIT.pdf
Description
Full printable version
Size
4.37 MB
Format
Adobe PDF
Checksum (MD5)
9a6396ed63207398d46c28b8ca7a5048
Author(s)
Dao, Steve Gia, 1973-
Advisor(s)
James Chung.
Date Issued
1998
Publisher
Massachusetts Institute of Technology
Description
Thesis (M.S.)--Massachusetts Institute of Technology, Dept. of Electrical Engineering and Computer Science, 1998.
Includes bibliographical references (leaves 98-100).
Subjects
Electrical Engineering and Computer Science
MIT Department
Massachusetts Institute of Technology. Department of Electrical Engineering and Computer Science
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